Описание
In the Linux kernel, the following vulnerability has been resolved: usb: usbip: fix a refcount leak in stub_probe() usb_get_dev() is called in stub_device_alloc(). When stub_probe() fails after that, usb_put_dev() needs to be called to release the reference. Fix this by moving usb_put_dev() to sdev_free error path handling. Find this by code review.
Пакеты
| Пакет | Статус | Версия исправления | Релиз | Тип |
|---|---|---|---|---|
| linux | fixed | 5.18.5-1 | package | |
| linux | fixed | 5.10.127-1 | bullseye | package |
Примечания
https://git.kernel.org/linus/9ec4cbf1cc55d126759051acfe328d489c5d6e60 (5.19-rc1)
Связанные уязвимости
In the Linux kernel, the following vulnerability has been resolved: usb: usbip: fix a refcount leak in stub_probe() usb_get_dev() is called in stub_device_alloc(). When stub_probe() fails after that, usb_put_dev() needs to be called to release the reference. Fix this by moving usb_put_dev() to sdev_free error path handling. Find this by code review.
In the Linux kernel, the following vulnerability has been resolved: usb: usbip: fix a refcount leak in stub_probe() usb_get_dev() is called in stub_device_alloc(). When stub_probe() fails after that, usb_put_dev() needs to be called to release the reference. Fix this by moving usb_put_dev() to sdev_free error path handling. Find this by code review.
In the Linux kernel, the following vulnerability has been resolved: usb: usbip: fix a refcount leak in stub_probe() usb_get_dev() is called in stub_device_alloc(). When stub_probe() fails after that, usb_put_dev() needs to be called to release the reference. Fix this by moving usb_put_dev() to sdev_free error path handling. Find this by code review.
In the Linux kernel, the following vulnerability has been resolved: usb: usbip: fix a refcount leak in stub_probe() usb_get_dev() is called in stub_device_alloc(). When stub_probe() fails after that, usb_put_dev() needs to be called to release the reference. Fix this by moving usb_put_dev() to sdev_free error path handling. Find this by code review.