Описание
On-Chip Debug and Test Interface With Improper Access Control and Improper Protection against Electromagnetic Fault Injection (EM-FI) in Nordic Semiconductor nRF52810 allow attacker to perform EM Fault Injection and bypass APPROTECT at runtime, requiring the least amount of modification to the hardware system possible.
On-Chip Debug and Test Interface With Improper Access Control and Improper Protection against Electromagnetic Fault Injection (EM-FI) in Nordic Semiconductor nRF52810 allow attacker to perform EM Fault Injection and bypass APPROTECT at runtime, requiring the least amount of modification to the hardware system possible.
Ссылки
- https://nvd.nist.gov/vuln/detail/CVE-2020-27211
- https://nvd.nist.gov/vuln/detail/CVE-2025-9709
- https://raelize.com/upload/research/2022/No_Hat_2022_-_Glitching_devices_for_code_execution_v1.1.pdf
- https://raelize.com/upload/research/2025/Dartmouth_202505_False-Injections-Tales-of-Physics-Misconceptions-and-Weird-Machines_v1.1.pdf
- https://www.toreon.com/cve-2025-9709-major-vulnerability-in-common-chip
Связанные уязвимости
On-Chip Debug and Test Interface With Improper Access Control and Improper Protection against Electromagnetic Fault Injection (EM-FI) in Nordic Semiconductor nRF52810 allow attacker to perform EM Fault Injection and bypass APPROTECT at runtime, requiring the least amount of modification to the hardware system possible.